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Analyzers cover multiple frequencies

01 Nov 2011  | Colin Holland

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Rohde & Schwarz's FSW signal and spectrum analyzer comes in three models that cover 2-8Hz, 13Hz, or 26.5GHz, and in 80- and 160MHz-bandwidth versions. As the eventual replacement for the FSU spectrum analyzer and the FSQ signal analyzer, the FSW targets use in development laboratories in aerospace, defense and communications. The FSU has a 20-67GHz frequency, and the FSQ has a 120MHz bandwidth and a 20Hz-40GHz frequency. Those units will remain in production for two to three years, and the FSW's specification will expand to match its predecessors' bandwidth and frequency.

A 12.1in touchscreen enables a multiview function to simultaneously display the results of multiple applications and eliminates time-consuming switching between applications. At a 10kHz carrier offset, the FSW achieves a phase-noise specification of less than −137dBc at 1Hz, which is as much as 10dB less than comparable instruments. This spec is important for developers of RF components and complete systems for radar applications.

With the optional FSW-K6, the FSW also supports analysis of pulsed signals. It allows the unit to measure wideband, hopping and chirp signals for wireless standards, such as 802.11ac. The device also enables developers to quickly detect spurious emissions.

The FSW can optionally include FSW-B13 switchable highpass filters for carrier frequencies as high as 1.5GHz for harmonic measurements on transmitter systems, resulting in improved dynamic range over conventional spectrum analyzers, and eliminating the need for external filters. This feature facilitates test-system setup for GSM communication, CDMA, WCDMA, LTE and TETRA systems for example.

The company's Legacy Pro technology enables the FSW to support the remote-control command sets of Rohde & Schwarz and other vendors' instruments. Users can exchange the FSW's internal solid-state disk for a neutral solid-state disk and can send their instruments for calibration without having any confidential test data leave the lab. Device-specific alignment data remains in the analyzer, separate from the user data.




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