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JTAG embedded test extends to Freescale's i.MX51 processors

17 Nov 2011

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Corelis Inc. has announced that its ScanExpress JTAG Embedded Test (JET) now supports the complete Freescale i.MX51 family of applications processors. The product provides at-speed testing of embedded processor-based electronic PCBs and systems to detect, isolate, and diagnose structural and functional defects with minimal development and investment.

The ScanExpress JET controls the i.MX51's ARM Cortex-A8 core through the JTAG debug port, enabling development and execution of binary and script test steps using a GUI on the host PCs, the company said. With its use on the i.MX51 processors designers can expect standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC and UART. It also provides fast in-system programming and testing of parallel and serial NOR and NAND Flash, the company added.

According to Corelis, other benefits of using the product includes fully automatic test development for all supported peripherals, integrated scripting environment for test customization and no boot code requirement for test execution.

Freescale's i.MX51 applications are targeted at consumer, industrial, automotive and general embedded applications, representing an ideal platform for ScanExpress JET. "Systems built around the i.MX51 are often designed to fit a particular form factor and need to be highly reliable," said Ryan Jones, senior technical marketing engineer at Corelis. "These constraints contribute to the need for automated, non-intrusive, at-speed functional tests. ScanExpress JET offers significant functional test coverage with minimal impact on the system design—a simple JTAG connection offers complete control over the CPU, allowing convenient and reusable tests for development and production."




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