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SiOnyx unveils ultra-low light CMOS image sensors

09 Apr 2013

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SiOnyx Inc. has introduced its line of CMOS image sensors that claims to offer unprecedented performance advantages in infrared imaging with sensitivity enhancements as high as 10x incumbent solutions. The XQE family includes three high performance sensors: the 1.3MP XQE-1310, the 1MP XQE-0920 and the 0.6MP XQE-0570. The XQE sensor family is based upon SiOnyx' black silicon semiconductor process technology that enhances the sensitivity of silicon based light detectors, the company indicated.

Infrared (IR) sensitivity is critical in many existing and emerging mass-market applications including biometrics, eye tracking, natural human interface (i.e. gesture UI) and surveillance. In human interface applications such as eye tracking and biometrics, IR sensing has the advantage of operating over a variety of lighting conditions without interfering with the user's visual experience. In surveillance, enhanced IR sensitivity takes advantage of the naturally occurring IR 'nightglow' to enable imaging under conditions that normally require very expensive image intensified night vision equipment.

All sensors in the XQE family share the benefits of ultra-low read noise for extended low light imaging and 72dB of native dynamic range, the firm noted. Additionally, all XQE sensors have on-chip HDR features that allow up to 120dB dynamic range capability. XQE sensors are fabricated with a standard CMOS process that offers low power, low dark current and no sensor cooling requirements. For applications from moonless night sky surveillance (<0.001 Lux) to biometrics and gesture UI, the SiOnyx XQE image sensors will redefine the way IR imaging systems are specified and deployed.

The introductory XQE device family includes:

SiOnyx XQE image sensors are sampling in 2Q13 to customers interested in evaluating the use of XQE image sensors in next generation imaging platforms.




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