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Juliet JTAG/boundery-scan tester expands ESA support

02 May 2013

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JTAG/boundery-scan tester

The Juliet desktop JTAG/boundery-scan tester from Goepel electronic recently received an upgrade which will allow the device to support additional embedded system access (ESA) technologies for high-speed in-system programming of flash, PLD, and microcontroller components, as well as structural and functional at-speed board test.

Juliet offers universal adapters to ease prototype UUT adaptation, an automated release mechanism, and a pneumatic locking mechanism. All configurations of the modular desktop system provide four independently programmable UUT voltages, including current measurements for two and four registers to accommodate gang applications. Juliet can be used for low-volume production applications, ranging from simple test execution to fault diagnosis in repair processes.

In addition to conventional boundary-scan test, Juliet supports processor emulation and chip-embedded instruments through the company's VarioTAP and ChipVORX platforms, respectively.

Further information regarding the Juliet tester can be found here.




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