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USB, LAN diode sensors tout fast power measurements

23 Feb 2015

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Rohde & Schwarz enhanced its sensor portfolio, with new models of its three-path diode sensors offering more flexibility. In addition to the USB sensors, new sensors that support LAN are now available.

Rohde & Schwarz presents its new R&S NRPxxS and R&S NRPxxSN USB three-path diode power sensors. The completely redesigned sensors offer measurement speed and accuracy, even at low levels. The R&S NRPxxSN model offers both a USB and a LAN interface. Both power sensor models are available for three different frequency ranges, from 10MHz to 8GHz, to 18GHz and to 33GHz.

The R&S NRPxxS/SN sensors enable 10,000 triggered measurements per second with a minimum trigger resolution of 100µs. A special mode even permits in excess of 50,000 equidistant measurements per second. And the improved three-path diode design made it possible to decrease the lower measurement limit to 70dBm. The result is a very wide dynamic range of 93dB and instruments that can measure up to four times faster than previous solutions, especially at low levels.

Rohde & Schwarz

The R&S NRPxxS and R&S NRPxxSN USB three-path diode power sensors are available for three different frequency ranges, from 10MHz to 8GHz, to 18GHz and to 33GHz.

The new LAN interface on the R&S NRPxxSN model now allows remote power measurements over large distances. For example, it is possible to control monitoring applications for satellite systems or particle accelerators via a central PC by placing sensors at various positions in the system. The power sensor is conveniently controlled from a GUI accessed via web browser. No additional software is needed.

Thanks to their outstanding performance, R&S NRPxxS/SN power sensors help mobile communications users perform power measurements on signals such as GSM, 3GPP, LTE and LTE-Advanced. The 33GHz model is also ideal for development and production of anticollision radar systems in the automotive sector. The continuous average, burst average, timeslot average, gate average and trace measurement test modes all remain available.




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