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Advantest outs sol'n for testing NAND flash devices

10 Jul 2013

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Advantest Corp. has announced its T5831 system for testing next-generation ICs used in mobile applications such as NAND Flash with high-speed ONFi or Toggle Mode interfaces as well as managed NAND devices such as embedded multimedia cards (eMMC). According to the company, the versatile tester supports concurrent testing of both NAND Flash and mobile DRAM in a multi-chip package (MCP).

The T5831's design enables highly parallel testing while delivering the required functionality at a low cost of test. It provides the most economical solution for today's testing needs with the upgradability to extend customers' return on investment for future requirements, stated Advantest. The accompanying engineering solution, T5831 ES, is geared for test program development and device characterisation, improving customers' overall time to market.

The system's Tester-Per-Site architecture enables high throughput and the industry's highest device power supply current per DUT speeds up programming and erasing operations, boasted the firm. In addition, tester hardware can perform on-the-fly analysis of error-correcting codes (ECC), eliminating all test time overhead associated with post-processing.

Real-time source-synchronous functionality maximises yields while improving throughput over traditional post-processing methods, detailed the company. The system automatically makes cycle-by-cycle adjustments to account for timing drifts due to differences in process-voltage-temperature (PVT) and jitter, ensuring data-eye accuracy for optimal yield at high speeds. Other necessary functions such as bad block management, redundancy analysis and custom/random data generation also are supported, making the T5831 the ideal tester for all NAND Flash testing needs, added Advantest.

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