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Image processing unit reduces pixel test cycle times by 46%

27 Nov 2013

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Semiconductor test equipment supplier Advantest has released an image processing unit intended to reduce the time for pixel size tests conducted on advanced CMOS image sensors. Advantest's T2000 ISS IPE2, which is currently available to customers worldwide, is expected to minimise the cost of producing smartphones, video camcorders and devices that use such image sensors.

Advantest's newest test module for its T2000 platform features an improved image-processing engine with a quad-core CPU. By incorporating four microprocessing cores, the flexible ISS IPE2 unit can assign an independent image-processing engine for each device undergoing simultaneous testing. This configuration can reduce test times by as much as 46 per cent for high-end CMOS image sensors with higher pixel counts.

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