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Monday Quiz: Sizing low-level measurements

22 Jun 2015  | Martin Rowe

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A measurement is only as good as the measurement equipment and the techniques used to make it. Noise, unwanted voltage and current, and external interference all contribute to measurement errors. By following one basic principles, you can minimise measurement errors.

This week's quiz was submitted by Jonathan Tucker from Keithley Instruments. The questions are based on Keithley's Low-Level Measurements Handbook, available as a free download. As always, answers appear on the last page.

1. Which of the following is not a currently accepted SI prefix?

  1. milli
  2. pico
  3. otto
  4. atto
  5. femto
  6. micro

SI prefix

2. Which of the following is not a potential cause of measurement errors when making low current measurements?

  1. Guarded circuits/cables
  2. Electrostatic coupling
  3. Source resistance too low
  4. Source capacitance too high
  5. Triboelectric charge
  6. Ionic contamination
  7. Excessive humidity

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